Jeroen Croon

 

current research:

  1. Modeling of RF building blocks in the Device Modelling and Characterisation group of NXP Semiconductors Research in Eindhoven, The Netherlands


education:

  1. 1998: M.Sc. in Applied Physics from the Delft University of Technology in The Netherlands
    thesis: Optimization of the receiver coil of an Overhauser MRI system at 77K and 300K, and
       recommendations for the design of the preamplifier

  2. 2004: Ph.D. in Electrical Engineering from the Catholic University of Leuven in Belgium
    thesis: Matching properties of deep submicron MOS transistors


The research for my Ph.D. was performed at IMEC in Leuven, Belgium.


other research:

  1. 2004: Characterization of MOS transistors fabricated on Germanium substrates


publications (first author):

  1. J.A. Croon, D.M.W. Leenaerts and D.B.M. Klaassen, “Accurate modeling of RF circuit blocks: weakly-nonlinear narrowband LNAs,” in Proc. of the Custom Integrated Circuit Conference, 2007

  2. J.A. Croon, W. Sansen and H.E. Maes, Matching properties of deep submicron MOS transistors, Springer-Verlag, 2005

  3. J.A. Croon, B. Kaczer, G.S. Lujan, S. Kubicek, G. Groeseneken and M. Meuris, “Experimental analysis of a Ge-HfO2-TaN gate stack with a large amount of interface states,” in Proc. of the International Conference on Microelectronic Test Structures, pp. 191-196, 2005

  4. J.A. Croon, L.H.A. Leunissen, M. Jurczak, M. Benndorf, R. Rooyackers, K. Ronse,
    S. Decoutere, W. Sansen and H.E. Maes, “Experimental investigation of the impact of line-edge roughness on MOSFET performance and yield,” in Proc. of the 33rd European Solid-State Device Research Conference, pp. 227-230, 2003

  5. J.A. Croon, G. Storms, S. Winkelmeier, I. Pollentier, M. Ercken, S. Decoutere, W. Sansen and H.E. Maes, “Line edge roughness: characterization, modeling and impact on device behavior,” International Electron Device Meeting, pp. 307-310, 2002

  6. J.A. Croon, M. Rosmeulen, S. Decoutere, W. Sansen and H.E. Maes, “An easy-to-use mismatch model for the MOS transistor,” IEEE Journal of Solid-State Circuits, vol. 37, no. 8, pp. 1056-1064, 2002

  7. J.A. Croon, E. Augendre, S. Decoutere, W. Sansen and H.E. Maes, “Influence of doping profile and halo implantation on the threshold voltage mismatch of a 0.13 μm CMOS technology,” in Proc. of the 32nd European Solid-State Device Research Conference, pp. 579-582, 2002

  8. J.A. Croon, H.P.Tuinhout, R. Difrenza, J. Knol, A.J. Moonen, S. Decoutere, H.E. Maes and W. Sansen, “A comparison of extraction techniques for threshold voltage mismatch,” in Proc. of the International Conference on Microelectronic Test Structures, pp. 235-240, 2002

  9. J.A. Croon, M. Rosmeulen, S. Decoutere, W. Sansen and H.E. Maes, “A simple characterization method for MOS transistor matching in deep submicron technologies,” in Proc. of the International Conference on Microelectronic Test Structures, pp. 213-218, 2001

  10. J.A. Croon, M. Rosmeulen, S. Decoutere, W. Sansen and H.E. Maes, “A simple and accurate deep submicron mismatch model,” in Proc. of the 30th European Solid-State Device Research Conference, pp. 356-359, 2000

  11. J.A. Croon, M. Rosmeulen, S. Van Huylenbroeck and S. Decoutere, “A general model for MOS transistor mismatch,” in Proc. of the 29th European Solid-State Device Research Conference, pp. 464-467, 1999

  12. J.A. Croon, H.M. Borsboom and A.F. Mehlkopf, “Optimization of low frequency litz-wire RF coils,” in Proc. of the 7th Scientific Meeting & Exhibition of the International Society for Magnetic Resonance in Medicine, p. 740, 1999

  13. J. Croon, S. Biesemans, S. Kubicek, E. Simoen, K. De Meyer an C. Claeys, “Freeze-out effects on the characteristics of deep submicron Si nMOSFETs in the 77 K to 300 K range,” in Proc. of the 4th Symposium on Low Temperature Electronics and High Temperature Superconductivity, pp.187-198, 1997


other presentations:

  1. MOSFET matching: Modeling, characterization and physical aspects
    presented in 2005 at the ICMTS in Leuven, Belgium, and at the MIGAS summer school in Autrans, France